Kit d'étalonnage TRL pour la caractérisation sub-mmWave sous pointes de InP-HEMT | Younes, R.
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Kit d'étalonnage TRL pour la caractérisation sub-mmWave sous pointes de InP-HEMT

Archive ouverte : Communication dans un congrès

Younes, R. | Wichmann, Nicolas | Lepilliet, Sylvie | Ducournau, Guillaume | Bollaert, S.

Edité par HAL CCSD

National audience. Nous proposons le développement de kits d’étalonnage on-wafer de type multiline Thru-ReflectLine pour mesurer des transistors à des fréquences au-delà de 110 GHz. L’objectif final est la mesure jusque 1,1THz de paramètres S de HEMT, dont la fréquence de coupure avoisine 1 THz. Une première conception de kit montre que l’utilisation de configurations adéquates aux bandes de fréquences utilisées dans l’étalonnage, optimisera nos mesures de la partie active de nos composants

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