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On-wafer differential noise figure measurement without couplers on a vector network analyzer

Archive ouverte : Communication dans un congrès

Andee, Yogadissen | Siligaris, Alexandre | Graux, Francois | Danneville, Francois

Edité par HAL CCSD ; IEEE

Isbn; 978-1-4799-7085-8. International audience. This papers presents a measurement technique for the noise figure of on-wafer differential amplifiers using 4-port network analyzers. The approach is based on the determination of the correlation of output noise waves in terms of the 4-port S-parameters and of the output noise powers. The measurement setup is simple as it does not require any hybrid coupler or calibrated noise source. Measurement results of an on-wafer differential LNA demonstrate the validity of the new technique.

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