Demagnetization analysis of an open-end windings 5-phase PMSM under transistor short-circuit fault

Archive ouverte : Communication dans un congrès

dos Santos Moraes, Tiago José | Semail, Eric | Nguyen, Ngac-Ky

Edité par HAL CCSD ; IEEE

International audience. For an open-end windings integrated Permanent Magnet Synchronous Machine, the demagnetization of the permanent magnets is analyzed when a transistor is short-circuited and no specific control strategy is adopted. Depending on the temperature, the high currents due to the inverter fault may locally demagnetized the permanent magnets leading to an accelerated aging of the machine and torque loss. A co-simulation, using a Finite Element software for the machine coupled with an average modeling of the transistor, gives interesting local prediction of the machine behavior in healthy and degraded mode.

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